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| Author | : |
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| Total Pages | : |
| Release | : 2014 |
| Genre | : Integrated circuits |
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| Total Pages | : |
| Release | : 2014 |
| Genre | : Integrated circuits |
| ISBN | : 9781479939299 |
| Author | : A. S. M. International |
| Publisher | : ASM International |
| Total Pages | : 561 |
| Release | : 2014-11-01 |
| Genre | : Technology & Engineering |
| ISBN | : 1627080740 |
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.
| Author | : Philip Ho |
| Publisher | : Institute of Electrical & Electronics Engineers(IEEE) |
| Total Pages | : 220 |
| Release | : 2003-01-01 |
| Genre | : Integrated circuits |
| ISBN | : 9780780377226 |
This text covers topics on: advanced failure analysis techniques; advanced interconnects; dielectrics and hot-carrier reliabilty; EOS/ESD and CMOS latchup; practical issues in building-in reliability; and reliability and failure analysis in specialist devices.
| Author | : |
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| Release | : 2011 |
| Genre | : Integrated circuits |
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| Author | : |
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| Total Pages | : 309 |
| Release | : 2007 |
| Genre | : Electronic book |
| ISBN | : 9781509085309 |
| Author | : Souvik Mahapatra |
| Publisher | : IEEE Computer Society Press |
| Total Pages | : 309 |
| Release | : 2007-01-01 |
| Genre | : Technology & Engineering |
| ISBN | : 9781424410149 |
| Author | : Lawrence C. Wagner |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 256 |
| Release | : 2012-12-06 |
| Genre | : Technology & Engineering |
| ISBN | : 1461549191 |
This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
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| Release | : 2012 |
| Genre | : Integrated circuits |
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| Author | : A. S. M. International |
| Publisher | : ASM International |
| Total Pages | : 634 |
| Release | : 2013-01-01 |
| Genre | : Technology & Engineering |
| ISBN | : 1627080228 |
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.
