Preservation And Dissemination Of The Hardcopy Documentation Portion Of The Ncsp Nuclear Criticality Bibliographic Database

The U.S. Department of Energy supports a nuclear criticality safety bibliographic internet database that contains approximately 15,000 records. We are working to ensure that a substantial portion of the corresponding hardcopy documents are preserved, digitized, and made available to criticality safety practitioners via the Nuclear Criticality Safety Program web site.

The Lawrence Livermore National Laboratory has prepared a Nuclear Criticality Safety Bibliographic Database that is now available via the Internet. This database is a component of the U.S. DOE Nuclear Criticality Safety Program (NCSP) Web site. This WWW resource was developed as part of the DOE response to the DNFSB Recommendation 97-2, which reflected the need to make criticality safety information available to a wide audience. To the extent possible, the hyperlinks on the Web pages direct the user to original source of the reference material in order to ensure accuracy and access to the latest versions. A master index is in place for simple navigation through the site. A search capability is available to assist in locating the on-line reference materials. Among the features included are: A user-friendly site map for ease of use; A personnel registry; Links to all major laboratories and organizations involved in the many aspects of criticality safety; General help for new criticality safety practitioners, including basic technical references and training modules; A discussion of computational methods; An interactive question and answer forum for the criticality safety community; and Collections of bibliographic references mdvahdation experiments. This paper will focus on the bibliographic database. This database evolved from earlier work done by the DOE's Nuclear Criticality Information System (NCIS) maintained at LLNL during the 1980s. The bibliographic database at the time of the termination of NCIS were composed principally of three parts: (1) A critical experiment bibliography of 1067 citations (reported in UCRL-52769); (2) A compilation of criticality safety papers from Volumes 1 through 41 of the Transactions of the American Nuclear Society (reported in UCRL-53369); and (3) A general criticality bibliography of several thousand citations (unpublished). When the NCIS project was terminated the database was nearly lost but, fortunately, several years later most of the data were restored from backup tapes that had been archived by LLNL's ICNC conferences and American Nuclear Society publications, Nuclear Science and Engineering and Nuclear Technology. Since the Rocky Flats facility is heading for closure maintenance of the database was again threatened. This has now been avoided since LLNL was selected in 1999 to fulfill part of the ''Information Preservation and Dissemination'' task of the DOE's Nuclear Criticality Safety Program Five-Year Plan. This effort will ''collect, preserve and make readily available criticality safety information'' and make the information available via the Internet.

A bibliographic criticality safety database of over 13,000 records is available on the Internet as part of the U.S. Department of Energy's (DOE) Nuclear Criticality Safety Program (NCSP) website. This database is easy to access via the Internet and gets substantial daily usage. This database and other criticality safety resources are available at ncsp.llnl.gov. The web database has evolved from more than thirty years of effort at Lawrence Livermore National Laboratory (LLNL), beginning with compilations of critical experiment reports and American Nuclear Society Transactions.

This useful guide contains more than 3,000 environmental acronyms and abbreviations. It also includes a glossary of more than 1,000 environmental terms for those frequently used but difficult to find expressions, written in non-technical, easy-to-understand language.

Provides evidence-based guidelines in schematic flowcharts, representing a step-by-step method of solving clinical problems in gynaecology.

World-renowned economist Klaus Schwab, Founder and Executive Chairman of the World Economic Forum, explains that we have an opportunity to shape the fourth industrial revolu­tion, which will fundamentally alter how we live and work. Schwab argues that this revolution is different in scale, scope and complexity from any that have come before. Characterized by a range of new technologies that are fusing the physical, digital and biological worlds, the developments are affecting all disciplines, economies, industries and governments, and even challenging ideas about what it means to be human. Artificial intelligence is already all around us, from supercomputers, drones and virtual assistants to 3D printing, DNA sequencing, smart thermostats, wear­able sensors and microchips smaller than a grain of sand. But this is just the beginning: nanomaterials 200 times stronger than steel and a million times thinner than a strand of hair and the first transplant of a 3D printed liver are already in development. Imagine “smart factories” in which global systems of manu­facturing are coordinated virtually, or implantable mobile phones made of biosynthetic materials. The fourth industrial revolution, says Schwab, is more significant, and its ramifications more profound, than in any prior period of human history. He outlines the key technologies driving this revolution and discusses the major impacts expected on government, business, civil society and individu­als. Schwab also offers bold ideas on how to harness these changes and shape a better future—one in which technology empowers people rather than replaces them; progress serves society rather than disrupts it; and in which innovators respect moral and ethical boundaries rather than cross them. We all have the opportunity to contribute to developing new frame­works that advance progress.

With the proliferation of packaging technology, failure and reliability have become serious concerns. This invaluable reference details processes that enable detection, analysis and prevention of failures. It provides a comprehensive account of the failures of device packages, discrete component connectors, PCB carriers and PCB assemblies.