Testing Complex And Embedded Systems

Many enterprises regard system-level testing as the final piece of the development effort, rather than as a tool that should be integrated throughout the development process. As a consequence, test teams often execute critical test plans just before product launch, resulting in much of the corrective work being performed in a rush and at the last minute. Presenting combinatorial approaches for improving test coverage, Testing Complex and Embedded Systems details techniques to help you streamline testing and identify problems before they occur—including turbocharged testing using Six Sigma and exploratory testing methods. Rather than present the continuum of testing for particular products or design attributes, the text focuses on boundary conditions. Examining systems and software testing, it explains how to use simulation and emulation to complement testing. Details how to manage multiple test hardware and software deliveries Examines the contradictory perspectives of testing—including ordered/ random, structured /unstructured, bench/field, and repeatable/non repeatable Covers essential planning activities prior to testing, how to scope the work, and how to reach a successful conclusion Explains how to determine when testing is complete Where you find organizations that are successful at product development, you are likely to find groups that practice disciplined, strategic, and thorough testing. Tapping into the authors’ decades of experience managing test groups in the automotive industry, this book provides the understanding to help ensure your organization joins the likes of these groups.

Another day without Test-Driven Development means more time wasted chasing bugs and watching your code deteriorate. You thought TDD was for someone else, but it's not! It's for you, the embedded C programmer. TDD helps you prevent defects and build software with a long useful life. This is the first book to teach the hows and whys of TDD for C programmers. TDD is a modern programming practice C developers need to know. It's a different way to program---unit tests are written in a tight feedback loop with the production code, assuring your code does what you think. You get valuable feedback every few minutes. You find mistakes before they become bugs. You get early warning of design problems. You get immediate notification of side effect defects. You get to spend more time adding valuable features to your product. James is one of the few experts in applying TDD to embedded C. With his 1.5 decades of training,coaching, and practicing TDD in C, C++, Java, and C# he will lead you from being a novice in TDD to using the techniques that few have mastered. This book is full of code written for embedded C programmers. You don't just see the end product, you see code and tests evolve. James leads you through the thought process and decisions made each step of the way. You'll learn techniques for test-driving code right nextto the hardware, and you'll learn design principles and how to apply them to C to keep your code clean and flexible. To run the examples in this book, you will need a C/C++ development environment on your machine, and the GNU GCC tool chain or Microsoft Visual Studio for C++ (some project conversion may be needed).

There are many books on project management and many on embedded systems, but few address the project management of embedded products from concept to production. Project Management of Complex and Embedded Systems: Ensuring Product Integrity and Program Quality uses proven Project Management methods and elements of IEEE embedded software develop

The book provides a practical and comprehensive overview of how to test embedded software. The book describes how embedded systems can be tested in a structured, controlled way. The first complete description of all necessary ingredients of a testing process. It includes classic as well as modern test design techniques. The described approach is useful in real-life situations of 'limited time and resources. Technology: More and more our society is pervaded by embedded software: cars, telecom, home entertainment devices are full of software. Embedded systems are becoming larger and more complex with an increasing amount of software, leading to a growing need for a structured testing method which helps to tackle the typical problems in embedded software testing. Audience: Managers or team leaders that are responsible for development and/or testing of embedded software and systems. Also, people who actually perform the primary software testing activities. User level: Intermediate. Bart Broekman has been a software test practitioner since 1990. He participated in European embedded software research projects (ITEA) and is co-author of a book on test automation. Edwin Notenboom has been a professional tester at Sogeti for six years. Together with Bart Broekman, he participated in a european ITEA project on embedded systems since February 1999.

This book introduces embedded software engineering and management methods, proposing the relevant testing theory and techniques that promise the final realization of automated testing of embedded systems. The quality and reliability of embedded systems have become a great concern, faced with the rising demands for the complexity and scale of system hardware and software. The authors propose and expound on the testing theory and techniques of embedded software systems and relevant environment construction technologies, providing effective solutions for the automated testing of embedded systems. Through analyzing typical testing examples of the complex embedded software systems, the authors verify the effectiveness of the theories, technologies and methods proposed in the book. In combining the fundamental theory and technology and practical solutions, this book will appeal to researchers and students studying computer science, software engineering, and embedded systems, as well as professionals and practitioners engaged in the development, verification, and maintenance of embedded systems in the military and civilian fields.

What the experts have to say about Model-Based Testing for Embedded Systems: "This book is exactly what is needed at the exact right time in this fast-growing area. From its beginnings over 10 years ago of deriving tests from UML statecharts, model-based testing has matured into a topic with both breadth and depth. Testing embedded systems is a natural application of MBT, and this book hits the nail exactly on the head. Numerous topics are presented clearly, thoroughly, and concisely in this cutting-edge book. The authors are world-class leading experts in this area and teach us well-used and validated techniques, along with new ideas for solving hard problems. "It is rare that a book can take recent research advances and present them in a form ready for practical use, but this book accomplishes that and more. I am anxious to recommend this in my consulting and to teach a new class to my students." �Dr. Jeff Offutt, professor of software engineering, George Mason University, Fairfax, Virginia, USA "This handbook is the best resource I am aware of on the automated testing of embedded systems. It is thorough, comprehensive, and authoritative. It covers all important technical and scientific aspects but also provides highly interesting insights into the state of practice of model-based testing for embedded systems." �Dr. Lionel C. Briand, IEEE Fellow, Simula Research Laboratory, Lysaker, Norway, and professor at the University of Oslo, Norway "As model-based testing is entering the mainstream, such a comprehensive and intelligible book is a must-read for anyone looking for more information about improved testing methods for embedded systems. Illustrated with numerous aspects of these techniques from many contributors, it gives a clear picture of what the state of the art is today." �Dr. Bruno Legeard, CTO of Smartesting, professor of Software Engineering at the University of Franche-Comt�Besan�, France, and co-author of Practical Model-Based Testing

Due to the decreasing production costs of IT systems, applications that had to be realised as expensive PCBs formerly, can now be realised as a system-on-chip. Furthermore, low cost broadband communication media for wide area communication as well as for the realisation of local distributed systems are available. Typically the market requires IT systems that realise a set of specific features for the end user in a given environment, so called embedded systems. Some examples for such embedded systems are control systems in cars, airplanes, houses or plants, information and communication devices like digital TV, mobile phones or autonomous systems like service- or edutainment robots. For the design of embedded systems the designer has to tackle three major aspects: The application itself including the man-machine interface, The (target) architecture of the system including all functional and non-functional constraints and, the design methodology including modelling, specification, synthesis, test and validation. The last two points are a major focus of this book. This book documents the high quality approaches and results that were presented at the International Workshop on Distributed and Parallel Embedded Systems (DIPES 2000), which was sponsored by the International Federation for Information Processing (IFIP), and organised by IFIP working groups WG10.3, WG10.4 and WG10.5. The workshop took place on October 18-19, 2000, in Schloß Eringerfeld near Paderborn, Germany. Architecture and Design of Distributed Embedded Systems is organised similar to the workshop. Chapters 1 and 4 (Methodology I and II) deal with different modelling and specification paradigms and the corresponding design methodologies. Generic system architectures for different classes of embedded systems are presented in Chapter 2. In Chapter 3 several design environments for the support of specific design methodologies are presented. Problems concerning test and validation are discussed in Chapter 5. The last two chapters include distribution and communication aspects (Chapter 6) and synthesis techniques for embedded systems (Chapter 7). This book is essential reading for computer science researchers and application developers.

Address Errors before Users Find Them Using a mix-and-match approach, Software Test Attacks to Break Mobile and Embedded Devices presents an attack basis for testing mobile and embedded systems. Designed for testers working in the ever-expanding world of "smart" devices driven by software, the book focuses on attack-based testing that can be used by individuals and teams. The numerous test attacks show you when a software product does not work (i.e., has bugs) and provide you with information about the software product under test. The book guides you step by step starting with the basics. It explains patterns and techniques ranging from simple mind mapping to sophisticated test labs. For traditional testers moving into the mobile and embedded area, the book bridges the gap between IT and mobile/embedded system testing. It illustrates how to apply both traditional and new approaches. For those working with mobile/embedded systems without an extensive background in testing, the book brings together testing ideas, techniques, and solutions that are immediately applicable to testing smart and mobile devices.

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.