Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2001

Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2001
Author: Wilson Tan
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
Total Pages: 262
Release: 2001
Genre: Technology & Engineering
ISBN: 9780780366756


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This volume contains the conference proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits.