Measurement Of Impurity Effects In The Mass Spectrometer Isotopic Analysis Of Uranium Hexafluoride

Advances in Mass Spectrometry, Volume 2 documents the proceedings of a conference on mass spectrometry held in Oxford in September 1961. This compilation is categorized into six major topics — mass spectrometry in research; mass spectrometry of inorganic compounds; instruments and techniques; theory and correlation of mass spectra; mass spectra and analysis; and ionization and dissociation. Under these major topics, parts of the papers discussed include field ionization mass spectroscopy; initial kinetic energy discrimination effects in crossed-field ion sources; mass spectrometric study of CaO and Ta; and spark source mass spectrometry as an analytical technique. The book also covers discussions on initial energy of hydrocarbon fragment ions; determination of the structure of alkaloids by mass spectrometry; and application of a time-of-flight mass spectrometer to the examination of ion-molecule interactions. This volume is a useful reference to students and researchers conducting work on mass spectrometry.

A method has been developed that uses uranium hexafluoride as the internal standard to quantitatively determine trace impurities in the uranium hexafluoride using relative response factors. A computer program was written to control the mass spectrometer and determine the concentrations of target impurities present. Overlapping spectra are deconvoluted using the Gauss-Seidel iterative method. The composition of the sample is determined by comparing the peak height ratios of the target impurities to the internal standard. Measurement parameters are easily modified using the menu driven program. A flexible database allows the list of target impurities to be extended to accommodate any changes in analytical requirements. The method has been adapted for automatic on-line measurements. The technique was evaluated by analysing a number of carefully prepared standards. Nine target impurities were studied which ranged in concentration from parts per million to percentages. An overall precision of fifteen percent was obtained.