Generation Measurement And Control Of Stray Radiation Iii

This work comprises the proceedings of the Fourth Symposium on Particles on Surfaces. Papers cover: adhesion-induced deformations of particles on surfaces; the use of atomic force microscopy in probing particle-particle adhesion; particle contamination in microelectronics, on spacecraft, and on optical surfaces; the role of air ionization in reducing surface contamination by particles in the cleanroom; abrasive blasting media for contamination-free deburring processes; and more.;The book is intended for physical, chemical, surface and colloid chemists, materials scientists; polymers, plastics, electrical and electronics, computer, chemical and mechanical engineers; and upper-level undergraduate and graduate students in these disciplines.

This volume is presented as a tribute to "two icons from the world of optics"--in the words of editors Harvey (Center for Research and Education in Optics and Lasers, U. of Central Florida) and Hooker (electrical and computer and engineering, U. of Colorado)--both of whom have been affiliated with the Optical Sciences Center at the U. of Arizona. Twenty-one papers from a tribute conference, some highly technical and others more personal, detail the honorees contributions to optics and optics education. These are followed by 45 journal article reprints authored by Bob Shannon and Roland Shack or their students in the technical areas of optical design and analysis, image evaluation, applications of the marginal ray height--chief ray height diagram, optical testing, optical fabrication, phased telescope arrays, aberration theory, propagation effects in the atmosphere, and diffraction/surface scatter phenomena. Finally, 14 short, informal "anecdotes and accolades" of the two scientists are presented from the conference and elsewhere. Annotation :2005 Book News, Inc., Portland, OR (booknews.com).

This new edition features numerous updates and additions. Especially 4 new chapters on Fiber Optics, Integrated Optics, Frequency Combs and Interferometry reflect the changes since the first edition. In addition, major complete updates for the chapters: Optical Materials and Their Properties, Optical Detectors, Nanooptics, and Optics far Beyond the Diffraction Limit. Features Contains over 1000 two-color illustrations. Includes over 120 comprehensive tables with properties of optical materials and light sources. Emphasizes physical concepts over extensive mathematical derivations. Chapters with summaries, detailed index Delivers a wealth of up-to-date references.