Characterization Of Thin Films And Solid Surfaces Using Proton Induced X Ray Emission

In recent years, powerful new physical techniques have been developed which are critical in studying surfaces of materials. A comprehensive review of surface analysis, this important volume surveys both principles and techniques of surface characterization, describes instrumentation, and suggests the course of future research. Divided into two sections-physical and chemical-this work emphasizes structural and compositional subsets of materials characterization.