An Introduction To Mixed Signal Ic Test And Measurement

With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topicswill help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples,exercises and problems.

Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on the subject of mixed-signal testing. While many books have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement. This book was written in response ot the shortage of basic course material for mixed-signal test and measurement. The book assumes a solid background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary. This material is designed to be useful as both a university textbook and as a reference manual for the beginning professional test engineer. The prerequisite for this book is a junior level course in linear continuous-time and discrete-time systems, as well as exposure ot elementary probability and statistical concepts. Chapter 1 presents an introduction to the context in which mixed-singal testing is performed and why it is necessary. Chapter 2 examines the process by which test programs are generated, from device data sheet to test plan to test code. Test program structure and functionality are also discussed in Chapter 2. Chapter 3 introduces basic DC measurement definitions, including continuity, leakage, offset, gain, DC power supply rejection ratio, and many other types of fundamental DC measurements. Chapter 4 covers the basics of absolute accuracy, resolution, software calibration, standards traceability, and measurement repeatability. In addition, basic data analysis is presented in Chapter 4. A more thorough treatment of data analysis and statistical analysis is delayed until Chapter 15. Chapter 5 takes a closer look at the architecture of a generic mixed-signal ATE tester. The generic tester includes instruments such as DC sources, meters, waveform digitizers, arbitrary waveform generators, and digital pattern generators with source and capture functionality. Chapter 6 presents an introduction to both ADC and DAC sampling theory. DAC sampling theory is applicable to both DAC circuits in the device under test and to the arbitrary waveform generators in a mixed-signal tester. ADC sampling theory is applicable to both ADC circuits in the device under test and to waveform digitizers in a mixed-signal tester. Coherent multi-tone sample sets are also introduced as an introduction to DSP based testing. Chapter 7 further develops sampling theory concepts and DSP-based testing methodologies, which are at the core of many mixed-signal test and measurement techniques. FFT fundamentals, windowing, frequency domain filtering, and other DSP-based testing fundamentals are covered in Chapter 6 and 7. Chapter 8 shows how basic AC channel tests can be performed economicaly using DSP-based testing. This chapter covers only non-sampled channels, consisting of combinations of op-amps, analog filters, PGAs and other continuous-time circuits. Chapter 9 explores many of these same tests as they are applied to sampled channels, which include DACs, ADCs, sample and hold (S/H) amplifiers, etc. Chapter 10 explains how the basic accuracy of ATE test equipment can be extended using specialized software routines. This subject is not necessarily taught in formal ATE tester classes, yet it is critical in the accurate measurement of many DUT performance parameters. Testing of DACs is covered in Chapter 11. Several kinds of DACs are studied, including traditional binary-weighted, resistive ladder, pulse with modulation (PWM), and sigma delta architectures. Traditional measurements like INL, DNL and absolute error are discussed. Chapter 12 builds upon the concepts in Chapter 11 to show how ADCs are commonly tested. Again, several different kinds of ADC's are studied, including binary-weighted, dual-slope, flash, semi-flash, and sigma-delta architectures. The weaknesses of each design are expalined, as well as the common methodologies used to probe their weaknesses. Chapter 13 explores the gray art of mixed-signal DIB design. Topics of interest include component selection, power and ground layout, crosstalk, shielding, transmission lines, and tester loading. Chapter 13 also illustrates several common DIB circuits and their use in mixed-signal testing. Chapter 14 gives a brief introduction to some of the techniques for analog and mixed-signal design for test. There are fewer structured approaches for mixed-signal DfT than for purely digital DfT. The more common ad-hoc methods are explained, as well as some of the industry standards such as IEEE Std. 1149.1 and 1149.4. A brief review of statistical analysis and Gaussian distributions is presented in Chapter 15. This chapter also shows how measurement results can be analyzed and viewed using a variety of software tools and display formats. Datalogs, shmoo plots, and histograms are discussed. Also, statistical process control (SPC) is explained, including a discussion of process control metrics such as Cp and Cpk. Chapter 16 examines the economis of production testing, The economics of testing are affected by many factors such as equipment purchase price, test floor overhead costs, test time, dual-head testing, multi-site testing, and time to market. A test engineer's debugging skills heavily impacts time to market. Chapter 16 examines the test debugging process to attempt to set down some general guidelines for debugging mixed-signal test programs. Finally, emerging trends that affect test economics and test development time are presented in Chapter 16. Some or all these trends will shape the future course of mixed-siganl test and measurement.

Radio-Frequency Integrated-Circuit Engineering addresses the theory, analysis and design of passive and active RFIC's using Si-based CMOS and Bi-CMOS technologies, and other non-silicon based technologies. The materials covered are self-contained and presented in such detail that allows readers with only undergraduate electrical engineering knowledge in EM, RF, and circuits to understand and design RFICs. Organized into sixteen chapters, blending analog and microwave engineering, Radio-Frequency Integrated-Circuit Engineering emphasizes the microwave engineering approach for RFICs. * Provides essential knowledge in EM and microwave engineering, passive and active RFICs, RFIC analysis and design techniques, and RF systems vital for RFIC students and engineers * Blends analog and microwave engineering approaches for RFIC design at high frequencies * Includes problems at the end of each chapter

Newnes has worked with Robert Pease, a leader in the field of analog design to select the very best design-specific material that we have to offer. The Newnes portfolio has always been know for its practical no nonsense approach and our design content is in keeping with that tradition. This material has been chosen based on its timeliness and timelessness. Designers will find inspiration between these covers highlighting basic design concepts that can be adapted to today's hottest technology as well as design material specific to what is happening in the field today. As an added bonus the editor of this reference tells you why this is important material to have on hand at all times. A library must for any design engineers in these fields. Hand-picked content selected by analog design legend Robert Pease Proven best design practices for op amps, feedback loops, and all types of filters Case histories and design examples get you off and running on your current project

Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. Introduces a novel component-testing philosophy for semiconductor test, product and design engineers Best new source of information for experienced semiconductor engineers as well as entry-level personnel Eight chapters about semiconductor testing

CMOS: Front-End Electronics for Radiation Sensors offers a comprehensive introduction to integrated front-end electronics for radiation detectors, focusing on devices that capture individual particles or photons and are used in nuclear and high energy physics, space instrumentation, medical physics, homeland security, and related fields. Emphasizing practical design and implementation, this book: Covers the fundamental principles of signal processing for radiation detectors Discusses the relevant analog building blocks used in the front-end electronics Employs systematically weak and moderate inversion regimes in circuit analysis Makes complex topics such as noise and circuit-weighting functions more accessible Includes numerical examples where appropriate CMOS: Front-End Electronics for Radiation Sensors provides specialized knowledge previously obtained only through the study of multiple technical and scientific papers. It is an ideal text for students of physics and electronics engineering, as well as a useful reference for experienced practitioners.

The book's text and many photographs introduce readers to the renowned teachers and researchers who are still well known in engineering circles. Electrical engineering is a protean profession. Today the field embraces many disciplines that seem far removed from its roots in the telegraph, telephone, electric lamps, motors, and generators. To a remarkable extent, this chronicle of change and growth at a single institution is a capsule history of the discipline and profession of electrical engineering as it developed worldwide. Even when MIT was not leading the way, the department was usually quick to adapt to changing needs, goals, curricula, and research programs. What has remained constant throughout is the dynamic interaction of teaching and research, flexibility of administration, the interconnections with industrial progress and national priorities. The book's text and many photographs introduce readers to the renowned teachers and researchers who are still well known in engineering circles, among them: Vannevar Bush, Harold Hazen, Edward Bowles, Gordon Brown, Harold Edgerton, Ernst Guillemin, Arthur von Hippel, and Jay Forrester. The book covers the department's major areas of activity -- electrical power systems, servomechanisms, circuit theory, communications theory, radar and microwaves (developed first at the famed Radiation Laboratory during World War II), insulation and dielectrics, electronics, acoustics, and computation. This rich history of accomplishments shows moreover that years before "Computer Science" was added to the department's name such pioneering results in computation and control as Vannevar Bush's Differential Analyzer, early cybernetic devices and numerically controlled servomechanisms, the Whirlwind computer, and the evolution of time-sharing computation had already been achieved.

This slide book introduces the demands of emerging power-supply integrated circuits (ICs) and discusses up-to-date circuit-design techniques aimed at addressing them, especially within the context of portable microelectronics. The presentation reflects the "top-down design" systems-to-circuits approach that industry adopts when developing power-supply systems. Within this framework, concepts evolve organically "from the ground up" with an educational mindset, rigorously surveying, analyzing, and evaluating basic theory and the state of the art. In this way, the material presents, explains, and shows how to understand, develop, and use semiconductor devices to model, analyze, and design ICs that supply and sustain microelectronic loads. The ultimate objective is to cultivate and develop insight and intuition. Some of the topics covered include power consumption, frequency response, feedback control, and power supply rejection.

Discover the concepts, architectures, components, tools, and techniques needed to design millimeter-wave circuits for current and emerging wireless system applications. Focusing on applications in 5G, connectivity, radar, and more, leading experts in radio frequency integrated circuit (RFIC) design provide a comprehensive treatment of cutting-edge physical-layer technologies for radio frequency (RF) transceivers - specifically RF, analog, mixed-signal, and digital circuits and architectures. The full design chain is covered, from system design requirements through to building blocks, transceivers, and process technology. Gain insight into the key novelties of 5G through authoritative chapters on massive MIMO and phased arrays, and learn about the very latest technology developments, such as FinFET logic process technology for RF and millimeter-wave applications. This is an essential reading and an excellent reference for high-frequency circuit designers in both academia and industry.