A Three Dimensional Vision System For Industrial Surface Topography Measurement

This fully illustrated text explains the basic measurement techniques, describes the commercially available instruments and provides an overview of the current perception of 3-D topography analysis in the academic world and industry, and the commonly used 3-D parameters and plots for the characterizing and visualizing 3-D surface topography. It also includes new sections providing full treatment of surface characterization, filtering technology and engineered surfaces, as well as a fully updated bibliography.

Machine Vision for Three-Dimensional Scenes contains the proceedings of the workshop "Machine Vision - Acquiring and Interpreting the 3D Scene" sponsored by the Center for Computer Aids for Industrial Productivity (CAIP) at Rutgers University and held in April 1989 in New Brunswick, New Jersey. The papers explore the applications of machine vision in image acquisition and 3D scene interpretation and cover topics such as segmentation of multi-sensor images; the placement of sensors to minimize occlusion; and the use of light striping to obtain range data. Comprised of 14 chapters, this book opens with a discussion on 3D object recognition and the problems that arise when dealing with large object databases, along with solutions to these problems. The reader is then introduced to the free-form surface matching problem and object recognition by constrained search. The following chapters address the problem of machine vision inspection, paying particular attention to the use of eye tracking to train a vision system; images of 3D scenes and the attendant problems of image understanding; the problem of object motion; and real-time range mapping. The final chapter assesses the relationship between the developing machine vision technology and the marketplace. This monograph will be of interest to practitioners in the fields of computer science and applied mathematics.

The subject of this book is surface metrology, in particular two major aspects: surface texture and roundness. It has taken a long time for manufacturing engineers and designers to realise the usefulness of these features in quality of conformance and quality of design. Unfortunately this awareness has come at a time when engineers versed in the use and specification of surfaces are at a premium. Traditionally surface metrology usage has been dictated by engineers who have served long and demanding apprenticeships, usually in parallel with studies leading to technician-level qualifications. Such people understood the processes and the achievable accuracies of machine tools, thereby enabling them to match production capability with design requirements. This synergy, has been made possible by the understanding of adherence to careful metrological procedures and a detailed knowledge of surface measuring instruments and their operation, in addition to wider inspection room techniques. With the demise in the UK of polytechnics and technical colleges, this source of skilled technicians has all but dried up. The shortfall has been made up of semi skilled craftsmen, or inexperienced graduates who cannot be expected to satisfy tradition al or new technology needs. Miniaturisation, for example, has had a pro found effect. Engineering parts are now routinely being made with nanometre surface texture and fiatness. At these molecular and atomic scales, the engineer has to be a physicist.

This textbook is designed for postgraduate studies in the field of 3D Computer Vision. It also provides a useful reference for industrial practitioners; for example, in the areas of 3D data capture, computer-aided geometric modelling and industrial quality assurance. This second edition is a significant upgrade of existing topics with novel findings. Additionally, it has new material covering consumer-grade RGB-D cameras, 3D morphable models, deep learning on 3D datasets, as well as new applications in the 3D digitization of cultural heritage and the 3D phenotyping of crops. Overall, the book covers three main areas: ● 3D imaging, including passive 3D imaging, active triangulation 3D imaging, active time-of-flight 3D imaging, consumer RGB-D cameras, and 3D data representation and visualisation; ● 3D shape analysis, including local descriptors, registration, matching, 3D morphable models, and deep learning on 3D datasets; and ● 3D applications, including 3D face recognition, cultural heritage and 3D phenotyping of plants. 3D computer vision is a rapidly advancing area in computer science. There are many real-world applications that demand high-performance 3D imaging and analysis and, as a result, many new techniques and commercial products have been developed. However, many challenges remain on how to analyse the captured data in a way that is sufficiently fast, robust and accurate for the application. Such challenges include metrology, semantic segmentation, classification and recognition. Thus, 3D imaging, analysis and their applications remain a highly-active research field that will continue to attract intensive attention from the research community with the ultimate goal of fully automating the 3D data capture, analysis and inference pipeline.

The field of optical metrology offers a wealth of both practical and theoretical accomplishments, and can cite any number of academic papers recording such. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked for a comprehensive handbook, one providing an overview of optical metrology that covers practical applications as well as fundamentals. Carefully designed to make information accessible to beginners without sacrificing academic rigor, the Handbook of Optical Metrology: Principles and Applications discusses fundamental principles and techniques before exploring practical applications. With contributions from veterans in the field, as well as from up-and-coming researchers, the Handbook offers 30 substantial and well-referenced chapters. In addition to the introductory matter, forward-thinking descriptions are included in every chapter that make this a valuable reference for all those involved with optical metrology.